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IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70
Tip: Data for a part may vary between manufacturers. You can filter for manufacturers on the top of the page next to the part image and part number.
Part # | Distributor | Description | Stock | Price | Buy | |
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DISTI #
2156-SN74BCT8373ADW-ND
|
DigiKey | IC SCAN TEST DEVICE LATCH 24SOIC Min Qty: 44 Lead time: 12 Weeks Container: Bulk MARKETPLACE PRODUCT |
2976 In Stock |
|
$6.8300 | Buy Now |
DISTI #
SN74BCT8373ADW-ND
|
DigiKey | IC SCAN TEST DEVICE LATCH 24SOIC Min Qty: 44 Lead time: 12 Weeks Container: Tube | Temporarily Out of Stock |
|
$8.5018 | Buy Now |
DISTI #
595-SN74BCT8373ADW
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Mouser Electronics | Specialty Function Logic Device w/Octal D-Type Latches RoHS: Compliant | 0 |
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$8.9000 / $9.2000 | Order Now |
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Quest Components | Latch, Single, 8 Bit, 24 Pin, Plastic, SOP | 184 |
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$7.2518 / $13.1850 | Buy Now |
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Rochester Electronics | SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches RoHS: Compliant Status: Active Min Qty: 1 | 2976 |
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$5.8600 / $6.9000 | Buy Now |
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Ameya Holding Limited | IC SCAN TEST DEVICE LATCH 24SOIC | 1975 |
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RFQ |
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SN74BCT8373ADW
Texas Instruments
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Datasheet
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SN74BCT8373ADW
Texas Instruments
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70
|
Pbfree Code | Yes | |
Rohs Code | Yes | |
Part Life Cycle Code | Active | |
Ihs Manufacturer | TEXAS INSTRUMENTS INC | |
Part Package Code | SOIC | |
Package Description | SO-24 | |
Pin Count | 24 | |
Reach Compliance Code | compliant | |
ECCN Code | EAR99 | |
HTS Code | 8542.39.00.01 | |
Samacsys Manufacturer | Texas Instruments | |
Control Type | ENABLE LOW/HIGH | |
Count Direction | UNIDIRECTIONAL | |
Family | BCT/FBT | |
JESD-30 Code | R-PDSO-G24 | |
JESD-609 Code | e4 | |
Length | 15.4 mm | |
Logic IC Type | BOUNDARY SCAN BUS DRIVER | |
Max Frequency@Nom-Sup | 20000000 Hz | |
Max I(ol) | 0.064 A | |
Moisture Sensitivity Level | 1 | |
Number of Bits | 8 | |
Number of Functions | 8 | |
Number of Ports | 2 | |
Number of Terminals | 24 | |
Operating Temperature-Max | 70 °C | |
Operating Temperature-Min | ||
Output Characteristics | 3-STATE | |
Output Polarity | TRUE | |
Package Body Material | PLASTIC/EPOXY | |
Package Code | SOP | |
Package Equivalence Code | SOP24,.4 | |
Package Shape | RECTANGULAR | |
Package Style | SMALL OUTLINE | |
Packing Method | TUBE | |
Peak Reflow Temperature (Cel) | 260 | |
Power Supply Current-Max (ICC) | 52 mA | |
Prop. Delay@Nom-Sup | 9.5 ns | |
Propagation Delay (tpd) | 10 ns | |
Qualification Status | Not Qualified | |
Seated Height-Max | 2.65 mm | |
Supply Voltage-Max (Vsup) | 5.5 V | |
Supply Voltage-Min (Vsup) | 4.5 V | |
Supply Voltage-Nom (Vsup) | 5 V | |
Surface Mount | YES | |
Technology | BICMOS | |
Temperature Grade | COMMERCIAL | |
Terminal Finish | NICKEL PALLADIUM GOLD | |
Terminal Form | GULL WING | |
Terminal Pitch | 1.27 mm | |
Terminal Position | DUAL | |
Time@Peak Reflow Temperature-Max (s) | 30 | |
Width | 7.5 mm |
This table gives cross-reference parts and alternative options found for SN74BCT8373ADW. The Form Fit Function (FFF) tab will give you the options that are more likely to serve as direct pin-to-pin alternates or drop-in parts. The Functional Equivalents tab will give you options that are likely to match the same function of SN74BCT8373ADW, but it may not fit your design. Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.
Part Number | Description | Manufacturer | Compare |
---|---|---|---|
SN74BCT8373DW | Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 | Texas Instruments | SN74BCT8373ADW vs SN74BCT8373DW |
SN74BCT8373ADWE4 | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 | Texas Instruments | SN74BCT8373ADW vs SN74BCT8373ADWE4 |
SN74BCT8373DWR | Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 | Texas Instruments | SN74BCT8373ADW vs SN74BCT8373DWR |
SN74BCT8373ADWG4 | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24 | Texas Instruments | SN74BCT8373ADW vs SN74BCT8373ADWG4 |
SN74BCT8373ADWR | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24 | Rochester Electronics LLC | SN74BCT8373ADW vs SN74BCT8373ADWR |
SN74BCT8373ADWRE4 | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24 | Texas Instruments | SN74BCT8373ADW vs SN74BCT8373ADWRE4 |
SN74BCT8373ADW | Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24, PLASTIC, SO-24 | Rochester Electronics LLC | SN74BCT8373ADW vs SN74BCT8373ADW |