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Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85
Tip: Data for a part may vary between manufacturers. You can filter for manufacturers on the top of the page next to the part image and part number.
Part # | Distributor | Description | Stock | Price | Buy | |
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DISTI #
296-22075-1-ND
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DigiKey | IC ABT SCAN TEST DEV3.3V 64TSSOP Min Qty: 1 Lead time: 18 Weeks Container: Cut Tape (CT), Digi-Reel®, Tape & Reel (TR) | Temporarily Out of Stock |
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$10.4497 / $17.1400 | Buy Now |
DISTI #
595-8V182512IDGGREP
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Mouser Electronics | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device RoHS: Compliant | 0 |
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$10.4500 | Order Now |
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Ameya Holding Limited | IC ABT SCAN TEST DEV3.3V 64TSSOP | 5950 |
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RFQ |
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8V182512IDGGREP
Texas Instruments
Buy Now
Datasheet
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8V182512IDGGREP
Texas Instruments
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85
|
Pbfree Code | Yes | |
Rohs Code | Yes | |
Part Life Cycle Code | Active | |
Ihs Manufacturer | TEXAS INSTRUMENTS INC | |
Part Package Code | TSSOP | |
Package Description | PLASTIC, TSSOP-64 | |
Pin Count | 64 | |
Reach Compliance Code | compliant | |
ECCN Code | EAR99 | |
HTS Code | 8542.39.00.01 | |
Samacsys Manufacturer | Texas Instruments | |
Control Type | INDEPENDENT CONTROL | |
Count Direction | BIDIRECTIONAL | |
Family | LVT | |
JESD-30 Code | R-PDSO-G64 | |
JESD-609 Code | e4 | |
Length | 17 mm | |
Logic IC Type | BOUNDARY SCAN REG BUS TRANSCEIVER | |
Max I(ol) | 0.032 A | |
Moisture Sensitivity Level | 1 | |
Number of Bits | 18 | |
Number of Functions | 18 | |
Number of Ports | 2 | |
Number of Terminals | 64 | |
Operating Temperature-Max | 85 °C | |
Operating Temperature-Min | -40 °C | |
Output Characteristics | 3-STATE WITH SERIES RESISTOR | |
Output Polarity | TRUE | |
Package Body Material | PLASTIC/EPOXY | |
Package Code | TSSOP | |
Package Shape | RECTANGULAR | |
Package Style | SMALL OUTLINE, THIN PROFILE, SHRINK PITCH | |
Packing Method | TR | |
Peak Reflow Temperature (Cel) | 260 | |
Power Supply Current-Max (ICC) | 24 mA | |
Prop. Delay@Nom-Sup | 5.7 ns | |
Propagation Delay (tpd) | 7.7 ns | |
Qualification Status | Not Qualified | |
Seated Height-Max | 1.2 mm | |
Supply Voltage-Max (Vsup) | 3.6 V | |
Supply Voltage-Min (Vsup) | 2.7 V | |
Supply Voltage-Nom (Vsup) | 3.3 V | |
Surface Mount | YES | |
Technology | BICMOS | |
Temperature Grade | INDUSTRIAL | |
Terminal Finish | NICKEL PALLADIUM GOLD | |
Terminal Form | GULL WING | |
Terminal Pitch | 0.5 mm | |
Terminal Position | DUAL | |
Time@Peak Reflow Temperature-Max (s) | 30 | |
Trigger Type | POSITIVE EDGE | |
Width | 6.1 mm |
This table gives cross-reference parts and alternative options found for 8V182512IDGGREP. The Form Fit Function (FFF) tab will give you the options that are more likely to serve as direct pin-to-pin alternates or drop-in parts. The Functional Equivalents tab will give you options that are likely to match the same function of 8V182512IDGGREP, but it may not fit your design. Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.
Part Number | Description | Manufacturer | Compare |
---|---|---|---|
74LVTH182512DGGRG4 | 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85 | Texas Instruments | 8V182512IDGGREP vs 74LVTH182512DGGRG4 |
SN74LVTH182512DGG | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64, PLASTIC, TSSOP-64 | Texas Instruments | 8V182512IDGGREP vs SN74LVTH182512DGG |
SN74LVTH182512DGGR | 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85 | Texas Instruments | 8V182512IDGGREP vs SN74LVTH182512DGGR |